Oblon, McClelland, Maier & Neustadt, L.L.P.Partner

Vincent Kendall Shier

About Vincent Kendall Shier

Vincent Kendall Shier is a lawyer practicing utility patent procurement & prosecution, ptab proceedings, chemicals and 3 other areas of law. Vincent received a Ph.D. degree from Pennsylvania State University, and has been licensed for 21 years. Vincent practices at Oblon, McClelland, Maier & Neustadt, L.L.P. in Alexandria, VA.

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Services

Areas of Law

  • Litigation
  • Other 5
    • Utility Patent Procurement & Prosecution
    • PTAB Proceedings
    • Chemicals
    • Life Sciences
    • Defective and Dangerous Products

Practice Details

  • Firm Information
    Position
    Partner
    Firm Name
    Oblon, McClelland, Maier & Neustadt, L.L.P.

Experience

  • Bar Admission & Memberships
    Admissions
    2005, Virginia
    U.S. District Court for the Eastern District of Virginia
    Registered to practice before the U.S. Patent and Trademark Office
    Memberships

    Professional Affiliations

    •American Bar Association, Section of Intellectual Property Law, Patent Inter Partes Proceedings Committee (Committee 104)
    Special Committee on Biotechnology, Chemistry, Medicine, and Pharmacology (Committee 160)
    •Intellectual Property Owners Association (IPO), Patent Office Practice (U.S.) Committee
    Patent Office Inter Partes Proceedings Committee
    •American Intellectual Property Law Association (AIPLA)

  • Education & Certifications
    Law School
    George Washington University Law School
    J.D.
    Other Education
    Pennsylvania State University
    Ph.D.
    Biological Chemistry

    University of Rochester
    B.A.
    Biology and Chemistry

Vincent Kendall Shier

Partner at Oblon, McClelland, Maier & Neustadt, L.L.P.
Not yet reviewed

1940 Duke StreetAlexandria, VA 22314U.S.A.

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Attorneys FAQs

  • What year was this attorney first admitted to the bar?
    Vincent Kendall Shier was admitted in 2005 to the State of Virginia.
  • Is this attorney admitted to practice in any U.S. Federal Courts?
    Vincent Kendall Shier is admitted to practice before the Patent Trial and Appeal Board and United States District Court for the Eastern District of Virginia.
  • How many attorneys are in this law firm?
    Oblon, McClelland, Maier & Neustadt, L.L.P. has 100 attorneys at this location.
  • What law school did this attorney attend?
    Vincent Kendall Shier attended George Washington University Law School.
  • What year was this attorney's law firm established?
    Oblon, McClelland, Maier & Neustadt, L.L.P. was established in 1968.