Jordan and Hamburg LLP

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Jordan and Hamburg LLP is a Law Firm in New York, New York

Address

122 East 42nd Street
New York, New York 10168 (New York Co.)

Phone

212-986-2340

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C. Bruce Hamburg (Member) admitted to bar, 1964, New York; 1964-1982, U.S. Court of Customs and Patent Appeals; 1974, U.S. District Court, Southern and Eastern Districts of New York; 1982, U.S. Court of Appeals for the Federal Circuit; registered to practice before U.S. Patent and Trademark Office. Education: Polytechnic Institute of Brooklyn (B.Ch.E., 1960); George Washington University (J.D., 1964). Tau Beta Pi; Phi Lambda Upsilon; Omega Chi Epsilon; Phi Alpha Delta. U.S. Patent Examiner, 1960-1963. Associate Editor of Patent Law Development, 1965-1969. Author: "The Doctrine of Equivalents in U.S.," 2d Edition, Korean, 1998; "The Doctrine of Equivalents in U.S.," book published 1995 (Japanese); "1983-1984 Patent Law Handbook," published by Clark Boardman Co., Ltd., 1983; "1984-1985 Patent Law Handbook," published by Clark Boardman Co., Ltd., 1984; "1985-1986 Patent Law Handbook," published by Clark Boardman Co., 1985; "Patent Fraud and Inequitable Conduct," published by Clark Boardman Co., Ltd., 1972, and supplemented in 1973, 1974, 1975 and 1977, 2nd edition, 1978, U.S. Chapter, "Patents Throughout the World," 1978—, editions, published by Clark Boardman Co.; "Legal Proceedings on Infringement of Patents in The U.S.," published in March and April, 1973 issues of Journal of the Japanese Group of A.I.P.P.I.; "U.S. Patent and Trademark Law Developments I," published in December, 1976 issue of The Patent Attorneys Association of Japan Journal; "U.S. Patent and Trademark Law Developments," monthly review in Patent and Trademark Review, 1976-1985, Bimonthly Review in Patents and Licensing, 1986—; "Current Essentials of U.S. Patent Practice in Outline Form," published by Clark Boardman Co., Ltd. in Patent Law Review, 1978; "Patent Protection of Microorganisms," published in Der Neuerer (German), June, 1985; "Copying of an Unpatented Product," published in Der Neuerer (German), October/November, 1985; "Two Recent CAFC Decisions on Claims Implicating Algorithms," published in May, 1990 issue of Journal of the Japanese Group of A.I.P.P.I. (Japanese); "The Doctrine of Equivalents," published in July, Aug., Sept., 1994 issue of Hatsumei Kyokai (The Invention Japanese); "The Doctrine of Equivalents," 2d Edition, published in April, May, June, 1998 issues of Hatsumei Kyokai, The Invention, Japanese. Member, Forum Committee on Franchising, 1979—. Member: American Bar Association; American Intellectual Property Law Association; New York Patent, Trademark and Copyright Law Association; International Association for the Protection of Intellectual Property; International Federation of Intellectual Property Attorneys Reported Cases: In re Gulack, 217 USPQ 401, Fed. Cir., 1983. Languages: German, Japanese, Korean and French. Practice Areas: Patents; Trademarks; Copyrights.

Frank J. Jordan (Member) admitted to bar, 1961, New York; 1963, U.S. District Court, Southern and Eastern Districts of New York; 1967, U.S. Supreme Court; 1968-1982, U.S. Court of Customs and Patent Appeals; 1982, U.S. Court of Appeals for the Federal Circuit; registered to practice before U.S. Patent and Trademark Office. Education: U.S. Merchant Marine Academy (B.S., 1953); New York Law School (J.D., 1961). Author: "U.S. Patent Law Revision," March, 1974; "The Lemon Tree Case," October, 1974; "Publication Under Deferred Examination System," June, 1975; "Priority Rights and Inventors Certificates," November, 1975; "Claim Glossary," March, 1976, all published in The Patent Attorneys Association of Japan Journal; "Patent Revision and Filing of Non-English Patent Applications," Scandinavian Journal on Intellectual Property," March, 1976; "Foreign Patent Applications Required to Meet U.S. Standards to Obtain Benefits of Convention Priority," February, 1975; "Deposit of Micro-organism in Foreign Depository Found Acceptable," October, 1975; "U.S. Restriction Practice," August, 1976; "U.S. Requirements Under the International Convention," August, 1976; "Duty to Disclose Prior Art in U.S.A.," June, 1977; "Patent Litigation in the U.S.A.," October, 1977; "New Matter in U.S. Patent Applications," December, 1977; "Design Patent Application in the U.S.A.," June, 1979; "Double Patenting," October, 1979; "Rule 132 Declarations," December, 1979; "Infringement Determination," February, 1980; "Patent Infringement and the U.S. Int'l Trade Commission," June, 1980; "Re-issue Patents," December, 1980; "Best Mode," April, 1981; "Reexamination in U.S.A.," August, 1981; "Prior Art Admissions," June, 1983; "Patent Marking," December, 1983; "Final Rejections," April, 1984; "Foreign Words as Trademarks and Their English Equivalents," August, 1984; "Maintenance Fees," December, 1984; "Semiconductor Chip Protection in U.S.A.," June, 1985; "Deposit of Microorganisms in Independent Depository Not required Prior to Filing Date of U.S. Patent Application," December, 1985; all published in "Patent and Licensing," IP-L Communications Inc. (formerly "Japan Engineering News, Inc."). Member: The Association of the Bar of the City of New York; New York Patent, Trademark and Copyright Law Association. [Lt., U.S. Navy, 1953-1955]. Languages: Japanese, German and Korean. Practice Areas: Patents; Trademarks; Copyrights.

ASSOCIATES

Herbert F. Ruschmann (Associate) admitted to bar, 1993, New Jersey and U.S. District Court, District of New Jersey; 1994, New York, Pennsylvania, U.S. Court of Appeals for the Federal Circuit and U.S. District Court, Eastern and Southern Districts of New York; registered to practice before U.S. Patent and Trademark Office. Education: University of Pennsylvania (B.S.E.E., 1982); Touro Law School (J.D., magna cum laude, 1993). Recipient, American Jurisprudence Award in Conflict of Laws. Member: New York State and American Bar Associations; American Intellectual Property Law Association and Institute of Electronic and Electrical Engineers (IEEE). Practice Areas: Patent Prosecution.

Lawrence I. Wechsler (Associate) born 1955; admitted to bar, 1980, New York; 1984, U.S. District Court, Eastern District of New York; registered to practice before U.S. Patent and Trademark Office. Education: Columbia University School of Engineering and Applied Science (B.S.Ch.E., 1976); St. John's University (J.D., 1979). Co-Author: "Electrical Resistivity of Absolute Water," American Laboratory, June, 1986; "Rotameter Correlation," Measurements and Controls," December, 1987; "Rotameter Correlation," Measurements and Controls, February, 1992.

Marvin Turken (Associate) admitted to bar, 1954, District of Columbia; 1954-1982, U.S. Court of Customs and Patent Appeals; 1958, New York and U.S. District Court for the District of Columbia; U.S. Court of Appeals for the District of Columbia Circuit; 1982, U.S. Court of Appeals for the Federal Circuit; registered to practice before U.S. Patent and Trademark Office. Education: Cooper Union (B.Ch.E., 1950); Georgetown University (J.D., 1954). Member: New York Patent, Trademark and Copyright Law Association. Practice Areas: Patents; Trademarks; Copyrights.

Stephen Chesnoff (Associate) admitted to bar, 1966, New York; 1969, District of Columbia and U.S. Supreme Court. Education: New York University, Stern School of Business (B.S., Economics, 1962) Brooklyn Law School (J.D., 1966). Member: Association of the Bar of the City of New York; American Bar Association; International Trademark Association.Email: Stephen Chesnoff

OF COUNSEL

Martin P. Hoffman (Of Counsel) admitted to bar, 1964, Virginia and District of Columbia; 1965, Illinois; registered to practice before U.S. Patent and Trademark Office. Education: New Jersey Institute of Technology (B.S.M.E., 1960); George Washington University (J.D., 1964). Omicron Delta Kappa; Pi Tau Sigma; Phi Alpha Delta (Vice Justice, 1963). Member: The District of Columbia Bar; Virginia State Bar; American Bar Association; American Intellectual Property Law Association. (Resident, Arlington, Virginia; Also Member of Hoffman, Wasson & Fallow, Arlington, Virginia). Practice Areas: Patents; Trademarks; Copyrights.


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